Fast, reliable memory testing for DDR1 DIMMs

The DDR Pro adapter (part number INN-8668-9) features advanced circuitry and a powerful high-frequency test engine. The DDR Pro allow you to fully test and identify PC433/466 DDR modules, with planned upgrades to higher speed devices.

The DDR Pro adapter plugs into the existing RAMCHECK base tester. This makes DDR Pro by far the most cost-effective solution for testing high-speed DDR modules. In fact, DDR Pro's features are what you would expect to find in test equipment that costs $20,000 or more. It works with both the RAMCHECK and RAMCHECK LX.

Don't let the adapter's small size fool you! High speed operations require short connections, while the adapter is loaded with state-of-the-art electronic components.

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No special setup is required. As with all of our products, the adapter is extraordinarily simple to use. Insert the adapter, turn the RAMCHECK/RAMCHECK LX tester on, place a module into the test socket, then press the start button.

DDR1 Advanced Technology

We have incorporated state-of-the-art technology in the design of the RAMCHECK DDR PRO Adapter.

The RAMCHECK DDR Pro adapter includes many features not available in our older DDR test adapter, including the ability to control voltage settings (2.2-3 volt) and CAS Latency selection.

As with all of our RAMCHECK/RAMCHECK LX testers, each module's size, structure, and type are automatically detected, without the need for user's setup. The test flow follows our standard Basic Test, Extensive Test, and Auto-Loop process. The RAMCHECK DDR1 adapter (DDR PRO) is very simple to operate, with little training or setup required.

DDR PRO Adapter on RAMCHECK LX

	RAMCHECK LX DDR1 features a large vivid display measuring 2.7" x 1.43" (69mm x 36.5mm). Easily viewable at an angle, from 3-4 feet away. Seen here is the startup screen once the RAMCHECK LX DDR1 is turned on.
Basic Test
	Basic Test screen shows the size, the speed, the voltage, the test pattern, the module's bank and the CAS Latency. This example shows testing at 400MHz with an automatic setting of CAS Latency to the default value of CL=3 for this frequency.
	Successful test phases conclude with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen, followed by a detailed test results summary screen.
Test Results
	Test results summary screens provide a wealth of information after each test phase. All summary screens are also added to the Test Log.
	Test Log collects and retains all intermediary test results while the memory devices undergo all of the test phases. The Test Log remains until a new test is initiated. The Test Log may be uploaded to a PC for printing via the USB interface. You can also save the file.
Extensive Test
	The EXTENSIVE Test performs various tests to establish memory quality.
	VOLTAGE CYCLING performs tests under allowable voltage deviations from the recommended VDD setting.
	MODE Test identifies various operational parameters of the device, including different bursts lengths and CAS latency settings.
	VOLTAGE BOUNCE tests data retention during voltage variation between read and write.
	MARCH UP/DOWN reveals adjacent cell interference problems.
	CHIP HEAT MODE tests at elevated operating temperatures.
	AUTO LOOP tests memory with endless pattern changes. Great for burn-in testing.
	The RAMCHECK LX provide advanced setup features. Certain timing parameters may be selected graphically as shown here.
	Make changes "on-the-fly" to test parameters with the push of a button.
SPD Editor
	The device's SPD can be conveniently viewed, edited and programmed on the RAMCHECK LX. You can also use our advanced SPD features in the PC RAMCHECK LX communications program.

DDR PRO Adapter on RAMCHECK

The older RAMCHECK tester has a smaller display than RAMCHECK LX. The following screens illustrate test result on RAMCHECK, compared to the RAMCHECK LX.

Basic Test
	Basic Test screen shows the size, the speed, the voltage, the test pattern, the module's bank and the CAS Latency. This example shows testing at 466MHz.
	Users can set up the frequency, the test voltage and the CAS LATENCY either through setup or CHANGE-ON-THE-FLY. This example shows a module that was setup to run at 500MHz and at 2.90V.
Chaneg-on-the-fly
	Expanded CHANGE-ON-THE-FLY can be used to setup the Frequency, the Voltage, the CAS LATENCY and the Refresh rate only for the current test. Following test, it returns to the current setup parameters.
	The DDR PRO allows you to set up the CAS LATENCY. This screen shows our default setup which allows the test program to selected CL=2 or CL=2.5 during each test phase.
	In this example, the CAS LATENCY was fixed to CL=2.5 throughout the tests.
	The new DDR PRO VDD Voltage setup allows the user to change on-the-fly the test voltage in the range 2.2V-3.0V. When set to AUTO, RAMCHECK automatically tests the module at 2.5V/2.7V.
Setup
	Setup Parameters menu allows the user to setup the Frequency, the Voltage, the CAS LATENCY, the Refresh rate and much more. These setup values remain in effect until changed by the user. Each parameter has a default value that can be reset by the user.
	Unlike the CHANGE-ON-THE-FLY above where the new voltage setup is effective for one test, you can use the Setup Parameters to change the test voltage parameters for all tests.
Test Results
	RAMCHECK Basic Test provides several screens for test result. The third structure screen shown here includes some of the new features of the DDR PRO, including the CAS LATENCY and the voltage setup.
	Here is another example where the CAS LATENCY was set at CL3 ONLY and the voltage left at automatic mode (2.5V for modules running up to 333MHz, 2.7V for higher speed modules).
Test Log
	RAMCHECK's built in test log shows the actual voltage of the test.
	CAS LATENCY override is shown in the Test Log. In this example, the module is tested at CL=3 only. In the automatic (default) mode, the CAS LATENCY is changed between CL=2 and CL=2.5