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RAMCHECK® DDR Pro High-Speed Adapter

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Fast, reliable memory testing for DDR1 DIMMs

The DDR Pro adapter (part number INN-8668-9) features advanced circuitry and a powerful high-frequency test engine. The DDR Pro allow you to fully test and identify PC433/466 DDR modules, with planned upgrades to higher speed devices.

The DDR Pro adapter plugs into the existing RAMCHECK base tester. This makes DDR Pro by far the most cost-effective solution for testing high-speed DDR modules. In fact, DDR Pro's features are what you would expect to find in test equipment that costs $20,000 or more. It works with both the RAMCHECK and RAMCHECK LX.

                        DDR memory tester

Don't let the adapter's small size fool you! High speed operations require short connections, while the adapter is loaded with state-of-the-art electronic components.

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No special setup is required. As with all of our products, the adapter is extraordinarily simple to use. Insert the adapter, turn the RAMCHECK/RAMCHECK LX tester on, place a module into the test socket, then press the start button.


DDR1 Advanced Technology

We have incorporated state-of-the-art technology in the design of the RAMCHECK DDR PRO Adapter.

DDR PRO adapter

1. Main controller featuring our improved high-speed DDR1 test engine.
2. Vtt generator for true STTL-2 testing.
3. Advanced analog section for measuring the module's current, voltages and the board's temperature.
4. Digitally-controlled high resolution VDD regulator.
5. 200-533MHz DDR1 clock generator.

The RAMCHECK DDR Pro adapter includes many features not available in our older DDR test adapter, including the ability to control voltage settings (2.2-3 volt) and CAS Latency selection.

As with all of our RAMCHECK/RAMCHECK LX testers, each module's size, structure, and type are automatically detected, without the need for user's setup. The test flow follows our standard Basic Test, Extensive Test, and Auto-Loop process. The RAMCHECK DDR1 adapter (DDR PRO) is very simple to operate, with little training or setup required.


DDR3 RAMCHECK LX DDR1 features a large vivid display measuring 2.7" x 1.43" (69mm x 36.5mm). Easily viewable at an angle, from 3-4 feet away. Seen here is the startup screen once the RAMCHECK LX DDR1 is turned on.
 Basic Test
                              Basic Test Basic Test screen shows the size, the speed, the voltage, the test pattern, the module's bank and the CAS Latency. This example shows testing at 400MHz with an automatic setting of CAS Latency to the default value of CL=3 for this frequency.
                              Basic Test OK Successful test phases conclude with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen, followed by a detailed test results summary screen.
  Test Results
RAMCHECK test log summary Test results summary screens provide a wealth of information after each test phase. All summary screens are also added to the Test Log.
RAMCHECK LX Test Log Test Log collects and retains all intermediary test results while the memory devices undergo all of the test phases. The Test Log remains until a new test is initiated. The Test Log may be uploaded to a PC for printing via the USB interface. You can also save the file.
 Extensive Test
RAMCHECK LX extensive test The EXTENSIVE Test performs various tests to establish memory quality.
voltage cycling VOLTAGE CYCLING performs tests under allowable voltage deviations from the recommended VDD setting.
                              Test MODE Test identifies various operational parameters of the device, including different bursts lengths and CAS latency settings.
Voltage Bounce VOLTAGE BOUNCE tests data retention during voltage variation between read and write.
March Up/March Down MARCH UP/DOWN reveals adjacent cell interference problems.
Chip Heat Mode CHIP HEAT MODE tests at elevated operating temperatures.
Autoloop AUTO LOOP tests memory with endless pattern changes. Great for burn-in testing.
RAMCHECK LX Test Log The RAMCHECK LX provide advanced setup features. Certain timing parameters may be selected graphically as shown here.
                              on the fly Make changes "on-the-fly" to test parameters with the push of a button.
   SPD Editor
RAMCHECK LX Test Log The device's SPD can be conveniently viewed, edited and programmed on the RAMCHECK LX. You can also use our advanced SPD features in the PC RAMCHECK LX communications program.


The older RAMCHECK tester has a smaller display than RAMCHECK LX. The following screens illustrate test result on RAMCHECK, compared to the RAMCHECK LX.

 Basic Test
DDR Pro screen Basic Test screen shows the size, the speed, the voltage, the test pattern, the module's bank and the CAS Latency. This example shows testing at 466MHz.
DDR Pro screen Users can set up the frequency, the test voltage and the CAS LATENCY either through setup or CHANGE-ON-THE-FLY. This example shows a module that was setup to run at 500MHz and at 2.90V.
DDR Pro screen Expanded CHANGE-ON-THE-FLY can be used to setup the Frequency, the Voltage, the CAS LATENCY and the Refresh rate only for the current test. Following test, it returns to the current setup parameters.
DDR3 The DDR PRO allows you to set up the CAS LATENCY. This screen shows our default setup which allows the test program to selected CL=2 or CL=2.5 during each test phase.
DDR Pro screen In this example, the CAS LATENCY was fixed to CL=2.5 throughout the tests.
DDR Pro screen The new DDR PRO VDD Voltage setup allows the user to change on-the-fly the test voltage in the range 2.2V-3.0V. When set to AUTO, RAMCHECK automatically tests the module at 2.5V/2.7V.
DDR Pro screen Setup Parameters menu allows the user to setup the Frequency, the Voltage, the CAS LATENCY, the Refresh rate and much more. These setup values remain in effect until changed by the user. Each parameter has a default value that can be reset by the user.
DDR Pro screen Unlike the CHANGE-ON-THE-FLY above where the new voltage setup is effective for one test, you can use the Setup Parameters to change the test voltage parameters for all tests.
  Test Results
DDR Pro screen RAMCHECK Basic Test provides several screens for test result. The third structure screen shown here includes some of the new features of the DDR PRO, including the CAS LATENCY and the voltage setup.
DDR Pro screen Here is another example where the CAS LATENCY was set at CL3 ONLY and the voltage left at automatic mode (2.5V for modules running up to 333MHz, 2.7V for higher speed modules).
 Test Log
DDR Pro screen RAMCHECK's built in test log shows the actual voltage of the test.
DDR Pro screen CAS LATENCY override is shown in the Test Log. In this example, the module is tested at CL=3 only. In the automatic (default) mode, the CAS LATENCY is changed between CL=2 and CL=2.5

As with all of our RAMCHECK testers, each module's size, structure, and type are automatically detected, without the need for user's setup. Test flow of the DDR modules follows our standard Basic Test, Extensive Test, and Auto-Loop process. DDR Pro is very simple to operate, with little training or setup required.

The DDR Pro also supports the RAMCHECK 200-pin S.O. DIMM DDR converter and the 66-pin DDR Chip Tester.

DDR1 Test Features
Supports Burst Length of 2, 4, and 8.
Supports CAS LATENCY of 2, 2.5, and 3. Default test allow automatic selection of CL=2 and CL=2.5 for different test phases. The user can select specific CL values using SETUP or the CHANGE-ON-THE-FLY feature.
DDR Data rates : 466MHz, 433MHz, 400MHz, 360MHz, 333MHz, 266MHz, 233MHz and 200MHz. (support for 533MHz and 500MHz will be added soon in the form of an optional hardware upgrade).
True 2.5V testing with a wide support range of 2.2V to 3.0V at 10mV increments. While this range is sufficient to cover all popular DDR module, it can be extended using a special setup code.
Improved current and temperature measurement circuitry.
Controlled Vtt for true STTL-2 compatibility.
Parallel testing capability of 64/72-bits.
Rugged, test-quality ZIF socket for covenient module handling.
Automatic detection and support for Registered/Unbuffered modules.
Automatic DQS8..0/DM8..0 or DQS17..0 support.
Four -S control lines for up to 4-rank devices.
Fourteen A13..0 address lines and three BA2..0 bank select address lines to support 4GB modules.
Complete SPD programming support.
Supports optional converter for 200-pin S.O. DIMM modules (p/n INN-8668-1) and future converters.

The DDR Pro manual addendum is available. If you need a test solution for non-standard or proprietary memory, the DDR Pro's advanced technology also makes it much easier to build customized adapters and converters. Current users of the older RAMCHECK DDR adapter (p/n INN-8668-6) may also convert their existing adapter to the RAMCHECK DDR Pro level at a substantial savings.

To order, call INNOVENTIONS at 1 (281) 879-6226, or click here to receive a price list. When ordering, please reference part number INN-8668-9. Please note that older RAMCHECK base testers may require a hardware upgrade in order to use the DDR Pro adapter. Please refer to this RAMCHECK upgrade page for more details.

INNOVENTIONS has contributed a new article about memory test trends for the BestTest Newsletter.

RAMCHECK LX DDR2 memory tester now available

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Optional adapters
240-pin DDR3 DIMM
204-pin DDR3 SO-DIMM adapter
204-pin DDR3 SO-DIMM converter
240-pin DDR2 DIMM
200-pin DDR2 SO-DIMM adapter
200-pin DDR2 SO-DIMM converter
184-pin DDR Pro
200-pin DDR SO-DIMM converter
100-pin DDR SODIMM
66-pin DDR Chip
168-pin SDRAM
200-pin Sun DIMM
50-pin EDO TSOP
72-pin SODIMM
30/72-pin SIMM