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RAMCHECK® DDR3 204-pin SO-DIMM Test Adapter

The RAMCHECK DDR3 SO-DIMM Adapter (p/n INN-8668-17) is the latest test adapter for the RAMCHECK LX memory tester. The 204-pin DDR3 SO-DIMM adapter is explicitly designed for x64 (non ECC) SO-DIMM modules up to 16GB. These SO-DIMM modules follow the JEDEC standard. (A small minority of the SO-DIMM modules are ECC (x72 bits) and they have a completely different wiring. We plan to support these modules later when demands increases and their JEDEC standard is finalized.)

The DDR3 adapter plugs into the existing RAMCHECK or RAMCHECK LX base tester, with no special setup required. The adapter is very simple to use: Just insert the adapter, turn the RAMCHECK/ RAMCHECK LX tester on, place a module into the test socket, then press the start button.

DDR3 SODIMM test module

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Unlike the DDR3 SO-DIMM converter solution which is used with the DDR3 DIMM adapter, this adapter is self-contained and features a rugged Yamaichi test socket manufactured specifically for high-volume testing, with a tested rating of about 10,000 insertion cycles.

As with all of our RAMCHECK/RAMCHECK LX test adapters, each module's size, structure, and type are automatically detected, without the need for user's setup. The test flow follows our standard Basic Test, Extensive Test, and Auto-Loop process. The RAMCHECK DDR3 SO-DIMM adapter is very simple to operate, with little training or setup required.


DDR3 RAMCHECK LX includes a large, vivid, high-contrast display measuring 2.7" x 1.43" (69mm x 36.5mm). Easily viewable at an angle, up to 3-4 feet away. Seen here is the startup screen once the RAMCHECK LX is turned on.
DDR3 prompt RAMCHECK LX prompts the user to insert a 204-pin DDR3 module and start the test with F1.
 Basic Test
                              Basic Test Basic Test screen shows the size, the speed, the voltage, the test pattern, the module's bank and the CAS Latency. This example shows testing at 1066MHz with an automatic setting of CAS Latency to the default value of CL=6 for this frequency.
                              Basic Test OK Successful test phases conclude with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen, followed by a detailed test results summary screen.
  Test Results
RAMCHECK test log summary This sample structure information screen indicates that the module was tested at the default 1.50V. CAS Latency was the automatically selected value of CL=7. Other values may be selected automatically (or by the user) for different frequencies.
RAMCHECK LX Test Log Test Log collects and retains all intermediary test results while the memory devices undergo all of the test phases. The Test Log remains until a new test is initiated. The Test Log may be uploaded to a PC for printing via the USB interface. You can also save the file.
 Change-on-the-fly and Setup
DDR3 coft Expanded CHANGE-ON-THE-FLY can be used to set up the Frequency, the Voltage, the CAS LATENCY and the Refresh rate only for the current test. Following the current test, it returns to the current setup parameters.
DDR3 cotf Here we demonstrate how the module's frequency is overriden to 866MHz from a previous test at 800MHz.
DDR3 cotf CAS Latency can be set at 5,6,7,8,9,10,11, and 12. Please note that not all DDR3 modules support all CL values.
DDR3 setup Various Rtt_NOM and Rtt_WR (dynamic Rtt) can be set up by the user.
DDR3 setup The DDR3 VDD Voltage setup allows the user to change on-the-fly the test voltage in the range 1.35V-1.8V. When set to AUTO, RAMCHECK automatically tests the module at 1.5V/1.6V. In this example, the user is selecting a VDD of 1.57 Volt.
 Wiring Errors Detection
Wiring Errors The DDR3 devices utilize the differential DQS technique which assigns a pair of two control lines per each DQS. In this test error example, DQS4 line (pin 84) was stuck at 1.
Wiring Errors Address lines errors in the DDR3 modules are reported explicitly as shown in this example. Here address line A2 (pin 61) is shorted to ground.
Wiring Errors The DDR3 module uses ODT control lines to activate the internal Rtt termination resistors. In this test error example, line ODT0 (pin 195) is shorted to ground.
 Extensive Test
RAMCHECK LX extensive test The EXTENSIVE Test performs various tests to establish memory quality.
voltage cycling VOLTAGE CYCLING performs tests under allowable voltage deviations from the recommended VDD setting.
                              Test MODE Test identifies various operational parameters of the device, including different bursts lengths and CAS latency settings.
Voltage Bounce VOLTAGE BOUNCE tests data retention during voltage variation between read and write.
March Up/March Down MARCH UP/DOWN reveals adjacent cell interference problems.
Chip Heat Mode CHIP HEAT MODE tests at elevated operating temperatures.
Autoloop AUTO LOOP tests memory with endless pattern changes. Great for burn-in testing.
RAMCHECK LX Test Log The RAMCHECK LX provide advanced setup features. Certain timing parameters may be selected graphically as shown here.
                              on the fly Make changes "on-the-fly" to test parameters with the push of a button.
   SPD Editor
RAMCHECK LX Test Log The device's SPD can be conveniently viewed, edited and programmed on the RAMCHECK LX. You can also use our advanced SPD features in the PC RAMCHECK LX communications program.
DDR3 Frequency Support

The RAMCHECK DDR3 tester can perform DDR3 tests at actual test frequencies up to 1066MHz. Modules designed for 1333MHz and 1600MHz (as well as future DDR3-1800, 1866, 2000, etc.) can be functionally tested on the DDR3 adapter but at a reduced frequency. The DDR3 test engine can achieve 1333MHz internal diagnostic speeds. Please see the product specifications for futher details.

PC3-6400 PC3-8500 PC3-10600
DDR3-800Mhz DDR3-1066Mhz DDR3-1333Mhz DDR3-1600Mhz
Test at full frequency Test at full frequency Test at lower frequency Test at lower frequency

Please make sure that your base tester (RAMCHECK LX or RAMCHECK) always has the latest firmware installed.

When ordering, please reference RAMCHECK DDR3 SO-DIMM Adapter part number INN-8668-17. This adapter is already compatible with all current RAMCHECK LX units. Note that older RAMCHECK base testers may require a factory hardware upgrade in order to use the DDR3 SO-DIMM adapter. Please refer to this RAMCHECK upgrade page for more details.

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Optional adapters
240-pin DDR3 DIMM
204-pin DDR3 SO-DIMM adapter
204-pin DDR3 SO-DIMM converter
240-pin DDR2 DIMM
200-pin DDR2 SO-DIMM adapter
200-pin DDR2 SO-DIMM converter
184-pin DDR Pro
200-pin DDR SO-DIMM converter
100-pin DDR SODIMM
66-pin DDR Chip
168-pin SDRAM
200-pin Sun DIMM
50-pin EDO TSOP
72-pin SODIMM
30/72-pin SIMM