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RAMCHECK® DDR3 Memory Test Adapter

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Fast, reliable memory testing for DDR3 DIMMs

The RAMCHECK DDR3 Adapter (p/n INN-8668-16) supports testing of 240-pin PC3-6400, PC3-8500, PC3-10600, PC3-12800, and PC3-14900 DDR3 memory, including unbuffered (UDIMM) and registered modules (RDIMM), both ECC and non-ECC, that comply with JEDEC standards, and LRDIMM (RAMCHECK LX only).

The DDR3 adapter plugs into the existing RAMCHECK or RAMCHECK LX base tester. This makes the DDR3 adapter by far the most cost-effective solution for testing modern high-speed DDR3 modules. In fact, its features are what you would expect to find in test equipment that costs $20,000 or more.

                        DDR3 memory tester

Don't let the adapter's small size fool you! High speed operations require short connections, while the adapter is loaded with state-of-the-art electronic components.

No special setup is required. As with all of our products, the adapter is extraordinarily simple to use. Insert the adapter, turn the RAMCHECK/RAMCHECK LX tester on, place a module into the test socket, then press the start button. Full details of the DDR3 adapter operation appears in the DDR3 Manual Addendum.

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DDR3 Advanced Technology

We have incorporated state-of-the-art technology in the design of the new RAMCHECK DDR3 Adapter.

DDR3 adapter board

1. Main controller featuring our improved 1066MHz test engine.
2. High efficiency switching power regulator to generate the DDR3 STTL-15 interface power source.
3. Advanced analog section for measuring the module's current, voltages and the board's temperature.
4. Digitally-controlled Vtt regulator.
5. 400-1333MHz DDR3 clock generator.
6. Digitally-controlled high resolution VDD high efficiency switching power regulator.

The RAMCHECK DDR3 adapter includes many new features which are relevant to the differences between DDR3 technology and the older DDR2 and DDR technology.

As with all of our RAMCHECK/RAMCHECK LX testers, each module's size, structure, and type are automatically detected, without the need for user's setup. The test flow follows our standard Basic Test, Extensive Test, and Auto-Loop process. The RAMCHECK DDR3 adapter is very simple to operate, with little training or setup required.

The DDR3 adapter was originally introduced for both the RAMCHECK LX (INN-8686) and the older RAMCHECK (INN-8668) base testers. In the past few years, increasingly larger sized modules require more current consumption, beyond the specifications of the older RAMCHECK base tester. Therefore, we recommend using the DDR3 adapter only with the RAMCHECK LX.

We offer a low-cost factory conversion of the older RAMCHECK to the current RAMCHECK LX level.

DDR3 Adapter Operation

DDR3 RAMCHECK LX DDR3 includes a large, vivid, high-contrast display measuring 2.7" x 1.43" (69mm x 36.5mm). Easily viewable at an angle, up to 3-4 feet away. Seen here is the startup screen once the RAMCHECK LX DDR3 tester is turned on.
Basic Test
                              Basic Test Basic Test screen shows the size, the speed, the voltage, the test pattern, the module's rank/bank and the CAS Latency. This example shows a 512Mx64 module testing at 1066MHz with an automatic setting of CAS Latency to the default value of CL=7 for this frequency. The test voltage is 1.50V.
                              Basic Test RAMCHECK LX displays the Manufacturer's official speed rating of the module at the bottom line. The manufacturer specifies the speed rating based on expensive and very complex certifying test equipment. Here the module is specified for 1866MHz.
                              Basic Test Basic Test screen also shows the time of test and the section of the module currently under test (in this example, B1/1 means Rank1, Bank1). The bottom line may show the speed rating in the PC3-xxxx JEDEC format. The 1866MHz module is PC3-14900.
                              Basic Test OK Successful test phases conclude with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen, followed by a detailed test results summary screen.
  Test Results
RAMCHECK LX BT summary Test results summary screens provide a wealth of information after each test phase. All summary screens are also added to the Test Log.
RAMCHECK LX Test Log Test Log collects and retains all intermediary test results while the memory devices undergo all of the test phases. The Test Log remains until a new test is initiated. The Test Log may be uploaded to a PC for printing via the USB interface. You can also save the file.
RAMCHECK LX Test Log Each module is marked with a unique serial number, as shwon in this screen. The SPD chip of this module does not have a temperature sensor.
RAMCHECK LX Test Log In addition to successful wiring tests, this screen shows detailed size information. Each chip is 512Mx8, using 16 rows and 10 columns addressing.
 Extensive Test
RAMCHECK LX extensive test The EXTENSIVE Test performs various tests to establish memory quality.
voltage cycling VOLTAGE CYCLING performs tests under allowable voltage deviations from the recommended VDD setting.
                              Test MODE Test identifies various operational parameters of the device, including different bursts lengths and CAS latency settings.
Voltage Bounce VOLTAGE BOUNCE tests data retention during voltage variation between read and write.
March Up/March Down MARCH UP/DOWN reveals adjacent cell interference problems.
Chip Heat Mode CHIP HEAT MODE tests at elevated operating temperatures. This test is performed only on the RAMCHECK LX. The older RAMCHECK cannot supply the required current consumption.
RAMCHECK LX Test Log FINAL TEST repeats the general Basic Test at the end of the Extensive Test flow.
RAMCHECK LX Test Log Successful Extensive Test concludes with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen.
The Test Log lists the results of all the phases of the Extensive Test. Here are the results of the MODE and the VOLTAGE CYCLING tests.
Autoloop AUTO LOOP tests memory with endless pattern changes. Great for burn-in testing.
Autoloop The AUTO-LOOP screen indicates the current loop number and the first data of the current complex pattern. The "39393939" hex marker is duplicated for the full 64/72 bit extended word.
Autoloop The AUTO-LOOP automatically cools down the tested module every 16 loops, so that the module's operation is checked with a changing temperature gradient. Other functions like self refresh or cke controlled power down mode are exercised.
 Change-on-the-fly and Setup
DDR3 coft Expanded CHANGE-ON-THE-FLY can be used to set up the Frequency, the Voltage, the CAS LATENCY and the Refresh rate only for the current test. Following the current test, it returns to the current setup parameters.
DDR3 cotf Here we demonstrate how the module's frequency is overriden to 866MHz from a previous test at 800MHz.
DDR3 cotf CAS Latency can be set at 5,6,7,8,9,10,11, and 12. Please note that not all DDR3 modules support all CL values.
DDR3 setup Various Rtt_NOM and Rtt_WR (dynamic Rtt) can be set up by the user.
DDR3 setup The DDR3 VDD Voltage setup allows the user to change on-the-fly the test voltage in the range 1.35V-1.8V. When set to AUTO, RAMCHECK automatically tests the module at 1.5V/1.6V. In this example, the user is selecting a VDD of 1.57 Volt.
RAMCHECK LX Test Log The RAMCHECK LX provide advanced setup features. Certain timing parameters may be selected graphically as shown here.
 Wiring Errors Detection
Wiring Errors The DDR3 devices utilize the differential DQS technique which assigns a pair of two control lines per each DQS. In this test error example, DQS4 line (pin 84) was stuck at 1.
Wiring Errors Address lines errors in the DDR3 modules are reported explicitly as shown in this example. Here address line A2 (pin 61) is shorted to ground.
Wiring Errors The DDR3 module uses ODT control lines to activate the internal Rtt termination resistors. In this test error example, line ODT0 (pin 195) is shorted to ground.
   SPD Editor
RAMCHECK LX Test Log The device's SPD can be conveniently viewed, edited and programmed on the RAMCHECK LX. You can also use our advanced SPD features in the PC RAMCHECK LX communications program.

The DDR3 Adapter incorporate numerous enhancement over our previous DDR2 technology, some of which are currently implement in the diagnostic tests and will be fully enabled in upcoming firmware versions. Please make sure that your base tester (RAMCHECK LX or RAMCHECK) always has the latest firmware installed. Please note that the following technical specifications are subject to change while we introduce this new DDR3 technology.

DDR3 Test Features
Supports Burst Length of 8, BC4 or 8 and BC4.
Supports both Read CAS LATENCY (CL) and Write CAS LATENCY (CWL) in the range of 5,6,7,8,9,10,11, and 12. Supports Additive Latency of 0, CL-1 and CL-2. Trcd is supported in the range of 4,5,6,7,8,9 and 10. Default test allows automatic selection of CL and CWL for different test phases. The user can select specific CL values using SETUP or the CHANGE-ON-THE-FLY feature.
Advanced timing circuitry and DCMs provides write leveling tests as well as differential delays along the input data path.
Support On-Die-Termination (ODT) including Rtt_NOM and dynamic ODT with Rtt_WR.
DDR3 Data rates : 800MHz and 1066MHz. Test engine reaches 1333Mhz on some tests. Higher speed DDR3 modules can still be tested at a lower frequency, as described below.
Supports new DDR3 reset function and the mode registers enhancements.
Test engine implement improved SRE (Self Refresh Entry) command as well as the new DDR3 long and short calibration commands (ZQCL/ZQCS).
Improved current and temperature measurement circuitry.
True 1.5V testing with a wide support range of 1.35V to 1.8V at 10mV increments. (Dual voltage DDR3L.)
Controlled Vtt for true STTL-15 compatibility.
Parallel testing capability of 64/72-bits.
Rugged, 240-pin test-quality ZIF socket for convenient module handling.
Automatic detection and support for Registered/Unbuffered modules.
Automatic DQS8..0/DM8..0 or DQS17..0 support.
Four -S control lines for up to 4-rank devices.
Fourteen A15..0 address lines and three BA2..0 bank select address lines to support 32GB modules.
Complete SPD programming support.
Supports converter for 204-pin S.O. DIMM modules and other future converters.

DDR3 Frequency Support

The RAMCHECK DDR3 tester can perform DDR3 tests at actual test frequencies up to 1066MHz. Modules designed for 1333MHz and 1600MHz (as well as future DDR3-1800, 1866, 2000, etc.) can be functionally tested on the DDR3 adapter but at a reduced frequency. The DDR3 test engine can achieve 1333MHz internal diagnostic speeds. Please see the product specifications for futher details.

PC3-6400 PC3-8500 PC3-10600
DDR3-800Mhz DDR3-1066Mhz DDR3-1333Mhz
Test at full frequency Test at full frequency Test at lower frequency
PC3-12800 PC3-14900
DDR3-1600Mhz DDR3-1866Mhz
Test at lower frequency Test at lower frequency

The DDR3 Manual Addendum is also available.

Please click here for pricing and further information, or call INNOVENTIONS at 1 (281) 879-6226. When ordering, please reference part number INN-8686-DDR3.

Learn more about the DDR3 adapter
DDR3 Manual Addendum

RAMCHECK LX DDR2 memory tester now available

中文 (简体)
中文 (繁體)

Optional adapters
240-pin DDR3 DIMM
204-pin DDR3 SO-DIMM adapter
204-pin DDR3 SO-DIMM converter
240-pin DDR2 DIMM
200-pin DDR2 SO-DIMM adapter
200-pin DDR2 SO-DIMM converter
184-pin DDR Pro
200-pin DDR SO-DIMM converter
100-pin DDR SODIMM
66-pin DDR Chip
168-pin SDRAM
200-pin Sun DIMM
50-pin EDO TSOP
72-pin SODIMM
30/72-pin SIMM