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RAMCHECK LX DDR4 PRO Memory Tester
The RAMCHECK LX DDR4 PRO (p/n INN-8686-DDR4-PRO) memory tester utilizes a rugged Low-Insertion-Force (LIF)
test socket that enables you to easily test large number of DDR4 modules.
It features a bright, vivid display, USB connectivity and the
latest components. With RAMCHECK LX DDR4, testing
DIMM, SO-DIMM and LRDIMM memory is fast and hassle-free. It also works with optional
the DDR3 240-pin, DDR2 240-pin and 184-pin DDR Pro adapters. (Discounted packages of the RAMCHECK LX base tester and DDR4, DDR3, DDR2 and DDR adapters are available.)
A combination package containing the RAMCHECK LX base tester and DDR4 DIMM PRO adapter, RAMCHECK LX DDR4 PRO is simple to use, with no complicated setup for the user. Just switch the RAMCHECK LX power on, insert a DDR4 DIMM into the test socket and then press the start button. That's all it takes! For more advanced users, optional features are available to change test parameters, read/write/edit SPD files and print the test logs.
See how easy it is to use RAMCHECK LX DDR4 PRO for yourself:
Since the RAMCHECK LX DDR4 PRO tester is both modular and very user friendly, it can be used right out of the box. Despite its simplicity to use, includes features found in testers that cost 10 times more!
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RAMCHECK LX automatically recognizes the DDR4 Series adapter. Seen here is the startup screen once the RAMCHECK LX DDR4 tester is turned on. |
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The DDR4 Series Adapter uses various test heads. Pressing the ESC button several times rapidly brings this screen that shows the test head configuration and the adapter's temperature. |
| Basic Test | |
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Basic Test screen shows the size, the test time, the speed, the voltage, the structure, the test pattern, the module's rank/bank, the CAS Latency and more. This example shows testing a 2GBx72 ECC Registered module. |
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The previous screen shows the standard structure '2Rx4'. This screen shows the test voltage, 1.20V. Basic Test screen also shows the time of test and the section of the module currently under test (in this example, B1/1 means Rank1, Bank1). |
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The first line of the Basic Test screen displays an animation process as the test process scans the memory array. The actual test of the DDR4 Series adapter is shown below the test animation line. |
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RAMCHECK LX displays the Manufacturer's official speed rating of the module at the bottom line. The manufacturer specifies the speed rating based on expensive and very complex certifying test equipment. Here is another module which is specified for 2400MHz. |
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This screen shows the test of another module, this time Unbuffered, 1Gx72 ECC DIMM. The current pattern is "AAAAAAA" while the pattern shown in the previous screens was "5555555". |
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This screen shows the test of a larger module, this time Registered, 4Gx72 ECC DIMM. The module is made of two ranks of x4 memory chips (2Rx4 structure). |
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Successful test phases conclude with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen, followed by a detailed test results summary screen. |
| Test Results | |
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Test results summary screens provide a wealth of information after each test phase. This screen provides summary of speed. |
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This summary screen includes structure information. All summary screens are also added to the Test Log. |
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Test Log collects and retains all intermediary test results while the memory devices undergo all of the test phases. The Test Log remains until a new test is initiated. The Test Log may be uploaded to a PC for printing via the USB interface. You can also save the file. |
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This screen is part of the detailed structure information detected by RAMCHECK LX. It reports that the set of connector wiring tests was successful. |
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This screen follows the previous one with module ID (s/n), as well as information about the temperature sensor inside the module's SPD chip. It reports successful address wiring tests in ranks 1 and 2. |
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This screen shows the final temperature during Basic Test and the timer reading. It also lists the manufacturer's speed rating. |
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This screen shows the size data captured for another large 32GB DDR4 module. This 4GBx72 2Rx4 module uses 2Gx4 DDR4 memory chips, with 16 banks and 17 row/10 column addressing. |
| Extensive Test | |
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The EXTENSIVE Test performs various tests to establish memory quality. EXTENSIVE Test for DDR4 was added with Firmware Version 3.36. |
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VOLTAGE CYCLING performs tests under allowable voltage deviations from the recommended VDD setting. |
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VOLTAGE BOUNCE tests data retention during voltage variation between read and write. For DDR4, bouncing is done between 1.14V to 1.26V, spanning the recommended VDD range. |
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CHIP HEAT MODE tests at elevated operating temperatures. The module is tested at the top recommended voltage for DDR4 (1.26V), while the program exercises all ranks of the module. |
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FINAL TEST repeats the general Basic Test at the end of the Extensive Test flow. |
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Successful Extensive Test concludes with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen. |
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TEST LOG The Test Log lists the results of all the phases of the Extensive Test. |
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In this screen, the Test Log completes the list of the results of all the phases of the Extensive Test. |
| Auto Loop | |
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AUTO LOOP tests memory with endless pattern changes. It's great for burn-in testing. |
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The AUTO-LOOP screen indicates the current loop number and the first data of the current complex pattern. The "8A8A8A8A" hex marker is duplicated for the full 64/72 bit extended word. |
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The AUTO-LOOP automatically cools down the tested module every 16 loops, so that the module's operation is checked with a changing temperature gradient. Other functions like self refresh or CKE controlled power down mode are exercised. |
| Change-on-the-fly and Setup | |
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Expanded CHANGE-ON-THE-FLY can be used to set up the Frequency, the Voltage, the CAS LATENCY and the Refresh rate only for the current test. Following the current test, it returns to the current setup parameters. |
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CAS Latency can be set at 9-24. The write CAS Latency (CWL) is dependent on the read CL, as shown. Please note that not all DDR4 modules support all CL values. |
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The DDR4 VDD Voltage setup allows the user to change on-the-fly the test voltage in the range 1.14V-1.26V. When set to AUTO, RAMCHECK LX automatically tests the module at 1.20V. In this example, the user is selecting a VDD of 1.24 Volt. |
| Wiring Errors Detection | |
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The DDR4 devices utilize the differential DQS technique which assigns a pair of two control lines per each DQS. In this test error example, DQS0 line (pin 153) was stuck at 0. |
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Address lines errors in the DDR4 modules are reported explicitly as shown in this example. Here address line A9 (pin 66) is shorted to ground. |
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Data line errors in DDR4 modules are reported explicitly as shown in this example. Here data line D30 (pin 43) is shorted to VDD. |
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The DDR4 module uses ODT control lines to activate the internal Rtt termination resistors. In this test error example, line ODT1 (pin 91) is shorted to ground. |
| SPD Editor | |
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The device's SPD can be conveniently viewed, edited and programmed on the RAMCHECK LX. You can also use our advanced SPD features in the PC RAMCHECK LX communications program. |
The test process for the RAMCHECK LX DDR4 follows the same test flow as the older RAMCHECK model. Each module's type, size, and structure are automatically detected, and the test flow follows our standard Basic Test, Extensive Test, and Auto-Loop process.
The RAMCHECK LX DDR4 Pro can also be purchased in the popular combination packages RAMCHECK LX DDR4 Pro/DDR3 (p/n INN-8686-DDR4P+3), and the RAMCHECK LX DDR3/DDR2/DDR1 (p/n INN-8686-DDR321).
Dimensions: 9.5"x6.3"x2.5".
Net Weight: @4 lbs.
Part number: INN-8686-DDR4-PRO
The RAMCHECK LX DDR4 PRO is a discounted package which
includes:
· RAMCHECK LX base
tester, p/n INN-8686
· 288-pin DDR4 Pro
adapter, p/n INN-8668-18-PRO
· A universal 240/100VAC switching power supply
· A USB cable
· CD Companion (includes detailed RAMCHECK LX Manual &
PC programs)
· 50-page printed manual
(Also available is a discounted RAMCHECK LX package
containing one or more of the the followin
DDR3, DDR2 and DDR1 DIMM adapters).
The RAMCHECK LX DDR4 Series adapter can perform DDR4 tests at actual test frequencies up to 1600MHz. All DDR4 Modules designed for higher frequencies (DDR4-3200, DDR4-2666, DDR4-2400, DDR4-2133 and DDR4-1866) can be functionally tested on the DDR4 Series adapter but at a reduced frequency.
The RAMCHECK LX manual and addendum are available online.
Please click here for pricing and further information, or call INNOVENTIONS at 1 (281) 879-6226. When ordering, please reference part number INN-8686-DDR4.
Made in USA of U.S. and imported parts
Click here
for RAMCHECK LX DDR4 brochure. (PDF file)