RAMCHECK LX DDR4 Series adapter

Fast, reliable memory testing for DDR4 Server and Desktop DIMMs

The RAMCHECK LX DDR4 DIMM Adapter (p/n INN-8686-18) supports testing of 288-pin DDR4 modules, including unbuffered (UDIMM), load-reduced (LRDIMM) and registered modules (RDIMM), both ECC and non-ECC, that comply with JEDEC standards. (Hybrid media like NVDIMM are not supported.) It consists of the DDR4 Series adapter and 288-pin test head.

PLEASE NOTE: The production socket for this adapter is replaceable because it will definitely wear out after some use. Therefore, like all of the test sockets we use, the one-year limited warranty does not cover this replaceable socket. For high volume testing, we recommend the 288-pin DDR4 DIMM Pro adapter (INN-8686-18-PRO), which features an extremely rugged high-quality test socket.

The DDR4 adapter plugs into the existing RAMCHECK LX base tester. This makes the DDR4 adapter by far the most cost-effective solution for testing modern high-speed DDR4 modules. In fact, its features are what you would expect to find in test equipment that costs thousands of dollars more.

NOTE: The DDR4 Series adapter will not work with the older RAMCHECK base tester p/n INN-8668. However, we do offer a low-cost factory conversion for RAMCHECK to RAMCHECK LX, so your investment in the older RAMCHECK is not obsolete.

RAMCHECK LX
DDR4 memory tester

The following picture shows the DDR4 Series adapter without the test head.

DDR4 Series
adapter without socket board

Don't let the adapter's small size fool you! High speed operations require short connections, while the adapter is loaded with state-of-the-art electronic components.

No special setup is required. As with all of our products, the adapter is extraordinarily simple to use. Insert the adapter, turn the RAMCHECK LX tester on, place a module into the test socket, then press the start button.

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The DDR4 288-pin Test Head (p/n INN-8686-18-1) is included with every order of the DDR4 Series adapter (p/n INN-8686-18). It features a high-quality production socket, not the very rugged ZIF socket. When the socket becomes worn out, the user can buy a low cost replacement test head, or return the test head to the factory for socket replacement. Each test head may be sent for factory socket replacement three times before the board itself becomes worn out. We also offer discounted 3-packs of the DDR4 288-pin Test Head to eliminate down time once the test socket is worn.

DDR4 Series and the 288-PIN
Socket Board

DDR4 Series Adapter

The RAMCHECK LX DDR4 Series adapter includes many new features which are relevant to the major differences between DDR4 technology and the older DDR3/2/1 technology.

DDR4 288-PIN
Socket Board

1.	Main engine featuring our improved 1600MHz test engine.
2.	High efficiency switching power regulator to generate the DDR4 VDD at digitally-controlled high resolution. Significantly higher current consumption is supported compared to our previous DDR3 adapter.
3.	Advanced analog section for measuring the module's current, voltages and the board's temperature.

4.	Digitally-controlled Vtt and Vref regulators.
5.	1333MHz-1600MHz DDR4 clock generator.
6.	Auxiliary power supplies provide highly-efficient voltage sources for the engine and for VPP and VDDSPD.

As with all of our other RAMCHECK LX adapters, each module's size, structure, and type are automatically detected, without the need for user's setup. The test flow follows our standard Basic Test, Extensive Test, and Auto-Loop process. The RAMCHECK LX DDR4 Series adapter is very simple to operate, with little training required.

DDR4 Series Adapter Operation

	RAMCHECK LX automatically recognizes the DDR4 Series adapter. Seen here is the startup screen once the RAMCHECK LX DDR4 tester is turned on.
	The DDR4 Series Adapter uses various test heads. Pressing the ESC button several times rapidly brings this screen that shows the test head configuration and the adapter's temperature.
Basic Test
	Basic Test screen shows the size, the test time, the speed, the voltage, the structure, the test pattern, the module's rank/bank, the CAS Latency and more. This example shows testing a 2GBx72 ECC Registered module.
	The previous screen shows the standard structure '2Rx4'. This screen shows the test voltage, 1.20V. Basic Test screen also shows the time of test and the section of the module currently under test (in this example, B1/1 means Rank1, Bank1).
	The first line of the Basic Test screen displays an animation process as the test process scans the memory array. The actual test of the DDR4 Series adapter is shown below the test animation line.
	RAMCHECK LX displays the Manufacturer's official speed rating of the module at the bottom line. The manufacturer specifies the speed rating based on expensive and very complex certifying test equipment. Here is another module which is specified for 2400MHz.
	This screen shows the test of another module, this time Unbuffered, 1Gx72 ECC DIMM. The current pattern is "AAAAAAA" while the pattern shown in the previous screens was "5555555".
	This screen shows the test of a larger module, this time Registered, 4Gx72 ECC DIMM. The module is made of two ranks of x4 memory chips (2Rx4 structure).
	Successful test phases conclude with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen, followed by a detailed test results summary screen.
Test Results
	Test results summary screens provide a wealth of information after each test phase. This screen provides summary of speed.
	This summary screen includes structure information. All summary screens are also added to the Test Log.
	Test Log collects and retains all intermediary test results while the memory devices undergo all of the test phases. The Test Log remains until a new test is initiated. The Test Log may be uploaded to a PC for printing via the USB interface. You can also save the file.
	This screen is part of the detailed structure information detected by RAMCHECK LX. It reports that the set of connector wiring tests was successful.
	This screen follows the previous one with module ID (s/n), as well as information about the temperature sensor inside the module's SPD chip. It reports successful address wiring tests in ranks 1 and 2.
	This screen shows the final temperature during Basic Test and the timer reading. It also lists the manufacturer's speed rating.
	This screen shows the size data captured for another large 32GB DDR4 module. This 4GBx72 2Rx4 module uses 2Gx4 DDR4 memory chips, with 16 banks and 17 row/10 column addressing.
Extensive Test
	The EXTENSIVE Test performs various tests to establish memory quality. EXTENSIVE Test for DDR4 was added with Firmware Version 3.36.
	VOLTAGE CYCLING performs tests under allowable voltage deviations from the recommended VDD setting.
	VOLTAGE BOUNCE tests data retention during voltage variation between read and write. For DDR4, bouncing is done between 1.14V to 1.26V, spanning the recommended VDD range.
	CHIP HEAT MODE tests at elevated operating temperatures. The module is tested at the top recommended voltage for DDR4 (1.26V), while the program exercises all ranks of the module.
	FINAL TEST repeats the general Basic Test at the end of the Extensive Test flow.
	Successful Extensive Test concludes with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen.
	TEST LOG The Test Log lists the results of all the phases of the Extensive Test.
	In this screen, the Test Log completes the list of the results of all the phases of the Extensive Test.
Auto Loop
	AUTO LOOP tests memory with endless pattern changes. Great for burn-in testing.
	The AUTO-LOOP screen indicates the current loop number and the first data of the current complex pattern. The "33CC33CC" hex marker is duplicated for the full 64/72 bit extended word.
	The AUTO-LOOP automatically cools down the tested module every 16 loops, so that the module's operation is checked with a changing temperature gradient. Other functions like self refresh or CKE controlled power down mode are exercised.
Change-on-the-fly and Setup
	Expanded CHANGE-ON-THE-FLY can be used to set up the Frequency, the Voltage, the CAS LATENCY and the Refresh rate only for the current test. Following the current test, it returns to the current setup parameters.
	CAS Latency can be set at 9-24. The write CAS Latency (CWL) is dependent on the read CL, as shown. Please note that not all DDR4 modules support all CL values.
	The DDR4 VDD Voltage setup allows the user to change on-the-fly the test voltage in the range 1.14V-1.26V. When set to AUTO, RAMCHECK LX automatically tests the module at 1.20V. In this example, the user is selecting a VDD of 1.24 Volt.
Wiring Errors Detection
	The DDR4 devices utilize the differential DQS technique which assigns a pair of two control lines per each DQS. In this test error example, DQS0 line (pin 153) was stuck at 0.
	Address lines errors in the DDR4 modules are reported explicitly as shown in this example. Here address line A9 (pin 66) is shorted to ground.
	Data line errors in DDR4 modules are reported explicitly as shown in this example. Here data line D30 (pin 43) is shorted to VDD.
	The DDR4 module uses ODT control lines to activate the internal Rtt termination resistors. In this test error example, line ODT1 (pin 91) is shorted to ground.
SPD Editor
	The device's SPD can be conveniently viewed, edited and programmed on the RAMCHECK LX. You can also use our advanced SPD features in the PC RAMCHECK LX communications program.

Please review: DDR4 Series Manual Addendum

DDR4 Frequency Support

The RAMCHECK LX DDR4 Series adapter can perform DDR4 tests at actual test frequencies up to 1600MHz. All DDR4 Modules designed for higher frequencies (DDR4-3200, DDR4-2666, DDR4-2400, DDR4-2133 and DDR4-1866) can be functionally tested on the DDR4 Series adapter but at a reduced frequency.

DDR4 288-pin DIMM PRO Test Head

For high volume testing we recommend using the 288-pin DIMM PRO test head, p/n INN-8686-18-8. This test head is included in the DDR4 Series Adapter Pro configuration (p/n INN-8686-18-PRO).

We are developing additional test heads for the DDR4 series:

DDR4 288-pin MINI DIMM Test Head, p/n INN-8686-18-3
DDR4 260-pin SODIMM PRO Test Head, p/n INN-8686-18-9

Note: The DDR4 Series adapter only works with the RAMCHECK LX. It does not work with our prior-generation RAMCHECK base tester. If you own the older RAMCHECK tester, please contact us for conversion or trade-in offers, or call INNOVENTIONS at 1 (281) 879-6226. When ordering, please reference part number INN-8686-18.