Fast, reliable memory testing for DDR3 DIMMs

The RAMCHECK DDR3 Adapter (p/n INN-8668-16) supports testing of 240-pin PC3-6400, PC3-8500, PC3-10600, PC3-12800, and PC3-14900 DDR3 memory, including unbuffered (UDIMM) and registered modules (RDIMM), both ECC and non-ECC, that comply with JEDEC standards, and LRDIMM (RAMCHECK LX only).

The DDR3 adapter plugs into the existing RAMCHECK or RAMCHECK LX base tester. This makes the DDR3 adapter by far the most cost-effective solution for testing modern high-speed DDR3 modules. In fact, its features are what you would expect to find in test equipment that costs $20,000 or more.

Don't let the adapter's small size fool you! High speed operations require short connections, while the adapter is loaded with state-of-the-art electronic components.

No special setup is required. As with all of our products, the adapter is extraordinarily simple to use. Insert the adapter, turn the RAMCHECK/RAMCHECK LX tester on, place a module into the test socket, then press the start button. Full details of the DDR3 adapter operation appears in the DDR3 Manual Addendum.

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DDR3 Advanced Technology

We have incorporated state-of-the-art technology in the design of the new RAMCHECK DDR3 Adapter.

The RAMCHECK DDR3 adapter includes many new features which are relevant to the differences between DDR3 technology and the older DDR2 and DDR technology.

As with all of our RAMCHECK/RAMCHECK LX testers, each module's size, structure, and type are automatically detected, without the need for user's setup. The test flow follows our standard Basic Test, Extensive Test, and Auto-Loop process. The RAMCHECK DDR3 adapter is very simple to operate, with little training or setup required.

The DDR3 adapter was originally introduced for both the RAMCHECK LX (INN-8686) and the older RAMCHECK (INN-8668) base testers. In the past few years, increasingly larger sized modules require more current consumption, beyond the specifications of the older RAMCHECK base tester. Therefore, we recommend using the DDR3 adapter only with the RAMCHECK LX.

We offer a low-cost factory conversion of the older RAMCHECK to the current RAMCHECK LX level.

DDR3 Adapter Operation

	RAMCHECK LX DDR3 includes a large, vivid, high-contrast display measuring 2.7" x 1.43" (69mm x 36.5mm). Easily viewable at an angle, up to 3-4 feet away. Seen here is the startup screen once the RAMCHECK LX DDR3 tester is turned on.
Basic Test
	Basic Test screen shows the size, the speed, the voltage, the test pattern, the module's rank/bank and the CAS Latency. This example shows a 512Mx64 module testing at 1066MHz with an automatic setting of CAS Latency to the default value of CL=7 for this frequency. The test voltage is 1.50V.
	RAMCHECK LX displays the Manufacturer's official speed rating of the module at the bottom line. The manufacturer specifies the speed rating based on expensive and very complex certifying test equipment. Here the module is specified for 1866MHz.
	Basic Test screen also shows the time of test and the section of the module currently under test (in this example, B1/1 means Rank1, Bank1). The bottom line may show the speed rating in the PC3-xxxx JEDEC format. The 1866MHz module is PC3-14900.
	Successful test phases conclude with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen, followed by a detailed test results summary screen.
Test Results
	Test results summary screens provide a wealth of information after each test phase. All summary screens are also added to the Test Log.
	Test Log collects and retains all intermediary test results while the memory devices undergo all of the test phases. The Test Log remains until a new test is initiated. The Test Log may be uploaded to a PC for printing via the USB interface. You can also save the file.
	Each module is marked with a unique serial number, as shwon in this screen. The SPD chip of this module does not have a temperature sensor.
	In addition to successful wiring tests, this screen shows detailed size information. Each chip is 512Mx8, using 16 rows and 10 columns addressing.
Extensive Test
	The EXTENSIVE Test performs various tests to establish memory quality.
	VOLTAGE CYCLING performs tests under allowable voltage deviations from the recommended VDD setting.
	MODE Test identifies various operational parameters of the device, including different bursts lengths and CAS latency settings.
	VOLTAGE BOUNCE tests data retention during voltage variation between read and write.
	MARCH UP/DOWN reveals adjacent cell interference problems.
	CHIP HEAT MODE tests at elevated operating temperatures. This test is performed only on the RAMCHECK LX. The older RAMCHECK cannot supply the required current consumption.
	FINAL TEST repeats the general Basic Test at the end of the Extensive Test flow.
	Successful Extensive Test concludes with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen.
	TEST LOG The Test Log lists the results of all the phases of the Extensive Test. Here are the results of the MODE and the VOLTAGE CYCLING tests.
	AUTO LOOP tests memory with endless pattern changes. Great for burn-in testing.
	The AUTO-LOOP screen indicates the current loop number and the first data of the current complex pattern. The "39393939" hex marker is duplicated for the full 64/72 bit extended word.
	The AUTO-LOOP automatically cools down the tested module every 16 loops, so that the module's operation is checked with a changing temperature gradient. Other functions like self refresh or cke controlled power down mode are exercised.
Change-on-the-fly and Setup
	Expanded CHANGE-ON-THE-FLY can be used to set up the Frequency, the Voltage, the CAS LATENCY and the Refresh rate only for the current test. Following the current test, it returns to the current setup parameters.
	Here we demonstrate how the module's frequency is overriden to 866MHz from a previous test at 800MHz.
	CAS Latency can be set at 5,6,7,8,9,10,11, and 12. Please note that not all DDR3 modules support all CL values.
	Various Rtt_NOM and Rtt_WR (dynamic Rtt) can be set up by the user.
	The DDR3 VDD Voltage setup allows the user to change on-the-fly the test voltage in the range 1.35V-1.8V. When set to AUTO, RAMCHECK automatically tests the module at 1.5V/1.6V. In this example, the user is selecting a VDD of 1.57 Volt.
	The RAMCHECK LX provide advanced setup features. Certain timing parameters may be selected graphically as shown here.
Wiring Errors Detection
	The DDR3 devices utilize the differential DQS technique which assigns a pair of two control lines per each DQS. In this test error example, DQS4 line (pin 84) was stuck at 1.
	Address lines errors in the DDR3 modules are reported explicitly as shown in this example. Here address line A2 (pin 61) is shorted to ground.
	The DDR3 module uses ODT control lines to activate the internal Rtt termination resistors. In this test error example, line ODT0 (pin 195) is shorted to ground.
SPD Editor
	The device's SPD can be conveniently viewed, edited and programmed on the RAMCHECK LX. You can also use our advanced SPD features in the PC RAMCHECK LX communications program.