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Disabling the Multi-Burst Technology for both DDR1 and DDR2 DevicesINN-8668-APN32 We have found from our own research and from input from our customers that some DDR/DDR2 devices may be sensitive to the Multi-Burst technology. If you encounter a DDR2 device that fails during the Multi-Burst in the Extensive and/or Auto Loop Test and the Extensive Test for DDR devices you can always disable the Multi-Burst Mode in either test phase. We will be addressing this in future firmware revisions. To disable Multi-Burst in the "Extensive Test" for the DDR Pro or DDR2 adapters please follow the instructions below: Press F2 for SETUP while the RAMCHECK is in Stand By mode. Press F2 again for TESTFLOW. Press F2 Again for SKIP TEST. Press F5 until MULTI-BURST is display. Press F3 until "SKIP THIS TEST" is display. Press F1 to Enter. Press ESC twice to save. You should see "Saving to EEPROM" flash on the LCD screen. To disable the Multi-Burst Technology during "Auto Loop Test" for the DDR2 adapter only please follow the instructions below: Press F2 for SETUP while the RAMCHECK is in Stand By mode. Press F2 for TESTFLOW Press F3 for EDIT TEST Press F5 for NEXT Press F2 for MULTI-BURST Press F4 to highlight "Disable Multi-Burst during Auto loop" Press F1 to Enter Press ESC four times to save it. You should see "Saving to EEPROM" flash on the LCD screen. You can confirm that it is saved by pressing F2 for SETUP, then F3 for LIST SETUP. You can re-enable the Multi-Burst by following the steps above except in step 6 press F3 to highlight "Enable Multi-Burst." You can also reset the tester to AUTO/DEFAULT by pressing F2 for Setup, then F4 for Auto. This will return all of the setup parameters to their default settings. If you still having test issues after you disabling the Multi-Burst during the AUTO Loop, please contact our technical support department at (281) 879-6226 M-F 9:00-5:00 Central Time, or send your E-mail to support@innoventions.com, or fax your message to (281) 879-6415. Please remember to include your phone and e-mail. |
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