RAMCHECK LX DDR2/1
RAMCHECK LX DDR2
RAMCHECK LX DDR1
RAMCHECK LX Base Tester
Calibration & Upgrades
Service & RMA Policy
RAMCHECK LX Conversion
Contact us at
Retest Counter for RAMCHECK and RAMCHECK LX
The retest counts are displayed in the test log after you complete each test as "BT RETEST=" for the Basic Test and "ET RETEST=" for the Extensive Test. Each counter is completely independent of each other, meaning that the BT RETEST counter only displays the count for the Basic Test and the ET RETEST counter only displays the count for the Extensive Test.
It should be emphasized again that having some retests does not necessarily mean that the module is bad. It is only a comparison tool used by advanced users to compare modules. For example, you may have four modules removed from a computer after intermittent failure. If all modules pass the RAMCHECK tests but one has an ET RETEST count of 10 while the others have less than 5, an advanced user may replace the module with the high retest count. Note that the replaced module still passed the RAMCHECK tests and therefore may still work well in another motherboard.
The following is a brief description of the retest mechanism. When the RAMCHECK / RAMCHECK LX encounter an error while testing a block of memory, it tries to verify the error by repetition of the test of the same block several times (depending on the actual test phase). Every repeated test increments the retest counter. If the memory block passes the test during these repetitions, the test proceeds to the next memory block. If the error persists, the tester determines whether this is a fatal error or if the frequency is too tight and needs to be reduced. Often, retesting the same block at the reduced frequency is successful and the full RAMCHECK test completes successfully.
For example, if you are testing a module in Basic Test and you get a retest count of three or more then there are two possibilities.
The Extensive Test RETEST may show higher values then the Basic Test since it is a much longer test. It should be further noted that a new complex Multi-Burst Technology that was recently added to the Extensive Test may cause high ET RETESTS due to the higher number of patterns being written and read to the memory module. The module should be regarded as fine if it completes the Extensive Test even if the ET RETEST is high. Multi-Burst Technology with the RAMCHECK and RAMCHECK LX is described in Application Note 31.
If you have additional questions, please contact our technical support department at (281) 879-6226 M-F 9:00-5:00 Central Time, or send your E-mail to email@example.com, or fax your message to (281) 879-6415. Please remember to include your phone and e-mail.
|Products | What's New | Sales | Tech Support | Downloads | Employment | Company | Contact Us|
|INNOVENTIONS® Inc. "INNOVATIVE PRODUCTS FROM
©1995, 2010 INNOVENTIONS, INC. All rights reserved.